Joachim Seland Graff

Employed in SINTEF since 2007 and has more than 15 years experience in sample preparation and material characterisation, running and maintaining advanced scientific equipment and material research on a variety of materials.

Education

2006: Cand. Scient (M.Sc) Institute of Physics, University of Oslo.
Thesis on determining the structure of an AlSiMn alloy using mainly transmission electron microscopy (TEM).

Competence and research areas

Material characterisation.

Scanning electron microscopy (SEM) incl.
- Energy Dispersive Spectroscopy (EDS)
- Electron backscatter diffraction (EBSD)

Sample preparation for electron microscopy
Topography measurements using White Light Interferometry (WLI)
Automation of equipment using simple programming in Python

Using the above techniques, I characterise materials in several categories such as ceramics, metals, silicon, and polymers for a long range of applications.

ORCID

https://orcid.org/0000-0001-6072-1334